A readout chip for diffraction imaging applications at new generation X-ray FELs (Free Electron Lasers) has been designed in a 65 nm CMOS technology. It consists of a 32 × 32 matrix, with square pixels and a pixel pitch of 110 µm. Each cell includes a low-noise charge sensitive amplifier (CSA) with dynamic signal compression, covering an input dynamic range from 1 to 104 photons and featuring single photon resolution at small signals at energies from 1 to 10 keV. The CSA output is processed by a time-variant shaper performing gated integration and correlated double sampling. Each pixel includes also a small area, low power 10-bit time-interleaved Successive Approximation Register (SAR) ADC for in-pixel digitization of the amplitude measurement. The channel can be operated at rates up to 4.5 MHz, to be compliant with the rates foreseen for future X-ray FEL machines. The ASIC has been designed in order to be bump bonded to a slim/active edge pixel sensor, in order to build the first demonstrator for the PixFEL (advanced X-ray PIXel cameras at FELs) imager.

PixFEL: development of an X-ray diffraction imager for future FEL applications / Lodola, Luca; Battignani, Giovanni; Bettarini, Stefano; Casarosa, Giulia; Fabris, Lorenzo; Forti, Francesco; Giorgi, Marcello; Grassi, Marco; Malcovati, Piero; Manghisoni, Massimo; Morsani, Fabio; Paladino, Antonio; Pancheri, Lucio; Paoloni, Eugenio; Ratti, Lodovico; Re, Valerio; Rizzo, Giuliana; Traversi, Gianluca; Vacchi, Carla; Dalla Betta, Gian-Franco; Benkechkache, Mohamed El Amine; Verzellesi, G.. - In: POS PROCEEDINGS OF SCIENCE. - ISSN 1824-8039. - (2017), p. 065. [10.22323/1.287.0065]

PixFEL: development of an X-ray diffraction imager for future FEL applications

Forti, Francesco;Paladino, Antonio;
2017

Abstract

A readout chip for diffraction imaging applications at new generation X-ray FELs (Free Electron Lasers) has been designed in a 65 nm CMOS technology. It consists of a 32 × 32 matrix, with square pixels and a pixel pitch of 110 µm. Each cell includes a low-noise charge sensitive amplifier (CSA) with dynamic signal compression, covering an input dynamic range from 1 to 104 photons and featuring single photon resolution at small signals at energies from 1 to 10 keV. The CSA output is processed by a time-variant shaper performing gated integration and correlated double sampling. Each pixel includes also a small area, low power 10-bit time-interleaved Successive Approximation Register (SAR) ADC for in-pixel digitization of the amplitude measurement. The channel can be operated at rates up to 4.5 MHz, to be compliant with the rates foreseen for future X-ray FEL machines. The ASIC has been designed in order to be bump bonded to a slim/active edge pixel sensor, in order to build the first demonstrator for the PixFEL (advanced X-ray PIXel cameras at FELs) imager.
2017
Front-end electronics for detector readout; Instrumentation for FEL; Instrumentation; Mathematical Physics
01 Pubblicazione su rivista::01a Articolo in rivista
PixFEL: development of an X-ray diffraction imager for future FEL applications / Lodola, Luca; Battignani, Giovanni; Bettarini, Stefano; Casarosa, Giulia; Fabris, Lorenzo; Forti, Francesco; Giorgi, Marcello; Grassi, Marco; Malcovati, Piero; Manghisoni, Massimo; Morsani, Fabio; Paladino, Antonio; Pancheri, Lucio; Paoloni, Eugenio; Ratti, Lodovico; Re, Valerio; Rizzo, Giuliana; Traversi, Gianluca; Vacchi, Carla; Dalla Betta, Gian-Franco; Benkechkache, Mohamed El Amine; Verzellesi, G.. - In: POS PROCEEDINGS OF SCIENCE. - ISSN 1824-8039. - (2017), p. 065. [10.22323/1.287.0065]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/1200375
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